File:AMN Michael Edwards inspects negatives for scratches, pinholes and defects as part of a quality control check in the photo lab - DPLA - 1723f80b6f6087bb23dcfe39d9175297.jpeg
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AMN Michael Edwards inspects negatives for scratches, pinholes and defects as part of a quality control check in the photo lab ( ) | ||||||||||||||||||||
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Creator InfoField | Department of Defense. American Forces Information Service. Defense Visual Information Center. 1994 | |||||||||||||||||||
Title |
AMN Michael Edwards inspects negatives for scratches, pinholes and defects as part of a quality control check in the photo lab |
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Description |
The original finding aid described this photograph as: Base: Spangdahlem Air Base State: Rheinland-Pfalz Country: Deutschland / Germany (DEU) Scene Camera Operator: AMN Michael Edwards Release Status: Released to Public |
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Date | Taken on 1 August 1981 | |||||||||||||||||||
Collection |
institution QS:P195,Q59661040 |
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Source/Photographer |
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Permission (Reusing this file) |
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Standardized rights statement InfoField |
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current | 22:02, 23 November 2020 | 1,890 × 2,810 (951 KB) | DPLA bot (talk | contribs) | Uploading DPLA ID 1723f80b6f6087bb23dcfe39d9175297 |
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Metadata
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Image title | AMN Michael Edwards inspects negatives for scratches, pinholes and defects as part of a quality control check in the photo lab. |
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Author | AMN Michael Edwards |
Source | Film |
Short title | DF-SN-82-09039 |
Date and time of data generation | 1 August 1981 |
City shown | SPANGDAHLEM AIR BASE |
JPEG file comment | File written by Adobe Photoshop¨ 5.2 |
IIM version | 2 |
Writer | C. Tordesillas |
Special instructions | RELEASED |
Country shown | WEST GERMANY |
Category | F |
Supplemental categories | UNCLASS |