File:A-sheartest1.jpg

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English: Shear test installation (TIRA Test 2805) for wafer bond measurements and characterization.
Source Own work
Author Fraunhofer ENAS, D. Neumann
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Attribution: Fraunhofer ENAS
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Date/TimeThumbnailDimensionsUserComment
current22:35, 9 April 2011Thumbnail for version as of 22:35, 9 April 2011655 × 439 (59 KB)Enaswiki (talk | contribs)Description inserted
09:53, 30 March 2011Thumbnail for version as of 09:53, 30 March 20112,048 × 1,371 (1.82 MB)Enaswiki (talk | contribs){{Information |Description ={{en|1=Shear test installation (TIRA Test 2805) for wafer bond measurements and characterization.}} |Source ={{own}} |Author =Fraunhofer ENAS, D. Neumann |Date =

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