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Summary

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Description
English: Cross-section SEM image of the eutectic bonding interface between Si and Au with 80.3 Si atom percentage.
Date
Source Y.-C. Lin and M. Baum and M. Haubold and J. Frömel and M. Wiemer and T. Gessner and M. Esashi, Development and evaluation of AuSi eutectic wafer bonding (2009)
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Fraunhofer ENAS, D. Neumann

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  • 2011-03-30 11:24 (UTC) | Enaswiki | 1179049 (bytes) | 1694×1153 | {{Information |Description = Cross-section SEM image of the eutectic bonding interface between Si and Au with 80.3 Si atom percentage. |Source = Y.-C. Lin and M. Baum and M. Haubold and J. Frömel and M. Wiemer and T. Gessner and M. Esashi, D

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current12:26, 27 December 2011Thumbnail for version as of 12:26, 27 December 20111,694 × 1,153 (1.12 MB)SreeBot (talk | contribs)(Original text) : {{Information |Description = Cross-section SEM image of the eutectic bonding interface between Si and Au with 80.3 Si atom percentage. |Source = Y.-C. Lin and M. Baum and M. Haubold and J. Frömel and M. Wiemer and T. Gessne

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