File:Fale - Monaco - 83.jpg

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Captions

Captions

Silicon wafer inspected with microscope for crystal growth defects
Description
English: Munich, Germany - Silicon wafer inspected with microscope for crystal growth defects. On the wall is a sample image of twin growth defect.
Italiano: Monaco, Germania
Source Own work
Author Fabio Alessandro Locati
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Creative Commons Attribution ShareAlike 3.0
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Date/TimeThumbnailDimensionsUserComment
current00:18, 26 October 2009Thumbnail for version as of 00:18, 26 October 20091,728 × 2,304 (1,023 KB)Rotatebot (talk | contribs)Bot: Rotate 270°
15:55, 25 October 2009Thumbnail for version as of 15:55, 25 October 20092,304 × 1,728 (1,009 KB)Fale (talk | contribs){{Information |Description={{en|Munich, Germany}} {{it|Monaco, Germania}} |Source=Myself |Date= |Author=Fabio Alessandro Locati |Permission=Creative Commons Attribution ShareAlike 3.0 |other_versions= }} {{cc-by-sa-3.0}} [[Category:Munich]

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