File:Infrared spectrophotomete w66344588 0 th83m026b.tif
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editDescriptionInfrared spectrophotomete w66344588 0 th83m026b.tif |
English: Close-up view of a sample being inserted into a Perkin-Elmer Model 735 Infrared Spectrophotometer in use at a General Instrument Corporation laboratory in Hicksville, New York. Per notations accompanying the photograph, the instrument is being used to analyze the encapsulating materials used in the company's semiconductor products to ensure uniformity. |
Date |
1970s date QS:P,+1970-00-00T00:00:00Z/8 |
Source | https://digital.sciencehistory.org/works/w66344588 |
Author | Perkin-Elmer Corporation |
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editCopyright determination made by Science History Institute (Q5090408) using RightsStatements.org
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current | 16:48, 24 February 2024 | 3,444 × 4,228, 2 pages (41.73 MB) | Frypie (talk | contribs) | Uploaded a work by Perkin-Elmer Corporation from https://digital.sciencehistory.org/works/w66344588 with UploadWizard |
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Camera manufacturer | Phase One |
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Camera model | IQ3 80MP |
Exposure time | 1/60 sec (0.016666666666667) |
ISO speed rating | 50 |
Date and time of data generation | 12:39, 9 March 2018 |
Width | 3,444 px |
Height | 4,228 px |
Bits per component |
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Compression scheme | Uncompressed |
Pixel composition | RGB |
Orientation | Normal |
Number of components | 3 |
Number of rows per strip | 1,024 |
Horizontal resolution | 400 dpi |
Vertical resolution | 400 dpi |
Data arrangement | chunky format |
Software used | Capture One 10 Macintosh |
Exposure Program | Manual |
Exif version | 2.3 |
Date and time of digitizing | 12:39, 9 March 2018 |
APEX shutter speed | 5.906891 |
Metering mode | Average |
Light source | Other light source |
Focal plane X resolution | 1,923.0769348145 |
Focal plane Y resolution | 1,923.0769348145 |
Focal plane resolution unit | 3 |
Sensing method | One-chip color area sensor |
File source | Digital still camera |
Scene type | A directly photographed image |
White balance | 5 |
Unique image ID | 00005000008200000400E0580000643D |