File:Megasims Genesis D2008 0416 D108 1000.jpg

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Description	Français : Le spectromètre de masse SIMS (Secondary Ion Mass Spectrometry ) est un des instruments utilisés pour analyser les atomes de vent solaire piégé dans les collecteurs de la sonde spatiale Genesis English: Secondary Ion Mass Spectrometry (SIMS)e is one of the instruments used for the characterization of the atoms of solar wind in the collectors of Genesis
Date	16 April 2008, 10:42:55
Source	http://genesismission.jpl.nasa.gov/gm2/images/gallery/megaSIMS/index.htm
Author	NASA

Licensing

	This file is in the public domain in the United States because it was solely created by NASA. NASA copyright policy states that "NASA material is not protected by copyright unless noted". (See Template:PD-USGov, NASA copyright policy page or JPL Image Use Policy.)
	Warnings: Use of NASA logos, insignia and emblems is restricted per U.S. law 14 CFR 1221. The NASA website hosts a large number of images from the Soviet/Russian space agency, and other non-American space agencies. These are not necessarily in the public domain. Materials based on Hubble Space Telescope data may be copyrighted if they are not explicitly produced by the STScI.[1] See also {{PD-Hubble}} and {{Cc-Hubble}}. The SOHO (ESA & NASA) joint project implies that all materials created by its probe are copyrighted and require permission for commercial non-educational use. [2] Images featured on the Astronomy Picture of the Day (APOD) web site may be copyrighted. [3] The National Space Science Data Center (NSSDC) site has been known to host copyrighted content. Its photo gallery FAQ states that all of the images in the photo gallery are in the public domain "Unless otherwise noted."

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	Date/Time	Thumbnail	Dimensions	User	Comment
current	21:22, 10 October 2013		1,000 × 739 (642 KB)	Pline (talk \| contribs)	User created page with UploadWizard

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Commons:WikiProject Aviation/recent uploads/2013 October 10

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Usage on fr.wikipedia.org
- Genesis (sonde spatiale)

Metadata

This file contains additional information such as Exif metadata which may have been added by the digital camera, scanner, or software program used to create or digitize it. If the file has been modified from its original state, some details such as the timestamp may not fully reflect those of the original file. The timestamp is only as accurate as the clock in the camera, and it may be completely wrong.

Image title	Aimee Meyer order 106544 MegaSims Mass Spectrometer, UCLA Geology building Analyzing Genesis sample return particles photog: Dutch Slager
Camera manufacturer	NIKON CORPORATION
Camera model	NIKON D2X
Exposure time	1/3 sec (0.33333333333333)
F-number	f/11
ISO speed rating	400
Date and time of data generation	10:42, 16 April 2008
Lens focal length	10.5 mm
Orientation	Normal
Horizontal resolution	300 dpi
Vertical resolution	300 dpi
Software used	Adobe Photoshop CS3 Windows
File change date and time	07:23, 13 May 2008
Exposure Program	Manual
Exif version	2.21
Date and time of digitizing	10:42, 16 April 2008
APEX shutter speed	1.584963
APEX aperture	6.918863
APEX exposure bias	0
Maximum land aperture	3 APEX (f/2.83)
Metering mode	Pattern
Light source	Cool white fluorescent (W 3900 – 4500K)
Flash	Flash did not fire
DateTime subseconds	29
DateTimeOriginal subseconds	29
DateTimeDigitized subseconds	29
Color space	Uncalibrated
Sensing method	One-chip color area sensor
File source	Digital still camera
Scene type	A directly photographed image
Custom image processing	Normal process
Exposure mode	Manual exposure
White balance	Manual white balance
Digital zoom ratio	1
Focal length in 35 mm film	15 mm
Scene capture type	Standard
Scene control	Low gain up
Contrast	Normal
Saturation	Normal
Sharpness	Soft
Subject distance range	Unknown
Image width	1,000 px
Image height	739 px
Serial number of camera	5061100
Lens used	10.5 mm f/2.8
Rating (out of 5)	0
Date metadata was last modified	00:23, 13 May 2008
Keywords	Spectrometer MegaSims Genesis
IIM version	2

File:Megasims Genesis D2008 0416 D108 1000.jpg

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16 April 2008

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Nikon D2X

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image/jpeg