File:Silicon growth defect border mag 200x.png
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| Description |
Title: Silicon growth defect interface, edge
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| Date | 13 September 2005 (original upload date) |
| Source | No machine-readable source provided. Own work assumed (based on copyright claims). |
| Author | No machine-readable author provided. Twisp assumed (based on copyright claims). |
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I, the copyright holder of this work, release this work into the public domain. This applies worldwide. In some countries this may not be legally possible; if so: I grant anyone the right to use this work for any purpose, without any conditions, unless such conditions are required by law. |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 00:27, 13 September 2005 | | 768 × 576 (587 KB) | Twisp (talk | contribs) | * Title: Silicon growth defect interface, overview * Desc: Image of growth defect interface on the edge of an Si wafer made using interference microscope with 200x magnification. * Author: Twisp * Date: 24.08.2005 |
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